Invention Grant
US09473121B1 Scannable flip-flop and low power scan-shift mode operation in a data processing system
有权
数据处理系统中的可扫描触发器和低功耗扫描移位模式操作
- Patent Title: Scannable flip-flop and low power scan-shift mode operation in a data processing system
- Patent Title (中): 数据处理系统中的可扫描触发器和低功耗扫描移位模式操作
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Application No.: US14799903Application Date: 2015-07-15
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Publication No.: US09473121B1Publication Date: 2016-10-18
- Inventor: Kumar Abhishek , Gaurav Goyal , Syed Shakir Iqbal
- Applicant: FREESCALE SEMICONDUCTOR, INC.
- Applicant Address: US TX Austin
- Assignee: FREESCALE SEMICONDUCTOR, INC.
- Current Assignee: FREESCALE SEMICONDUCTOR, INC.
- Current Assignee Address: US TX Austin
- Main IPC: H03K3/356
- IPC: H03K3/356 ; H03K3/3562
Abstract:
A scannable flip-flop circuit and method for low power scan operation are provided. The scannable flip-flop includes a flip-flop for receiving an input signal, and for generating a flip-flop output signal. The scannable flip-flop also includes a voltage selection circuit coupled to the flip-flop. The voltage selection circuit supplies a first voltage to the flip-flop during a first state of a voltage selection signal, and supplies a second voltage to the flip-flop during a second state of the voltage selection signal. A series of scannable flip-flops may be arranged in a scan chain for testing during a scan test mode.
Information query
IPC分类:
