Invention Grant
- Patent Title: Method and apparatus for analyzing pilot pollution
- Patent Title (中): 分析试点污染的方法和装置
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Application No.: US13899167Application Date: 2013-05-21
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Publication No.: US09473948B2Publication Date: 2016-10-18
- Inventor: Junquan Ding , Xiaojun Cui
- Applicant: Huawei Technologies Co., Ltd.
- Applicant Address: CN Shenzhen
- Assignee: Huawei Technologies Co., Ltd.
- Current Assignee: Huawei Technologies Co., Ltd.
- Current Assignee Address: CN Shenzhen
- Priority: CN201210168702 20120528
- Main IPC: H04W16/18
- IPC: H04W16/18 ; H04W24/10 ; G06T11/40

Abstract:
Embodiments of the present invention disclose a method for analyzing pilot pollution, and further disclose an apparatus for analyzing pilot pollution. The method includes: generating a preprocessed map according to an actual engineering parameter table and drive test data that are in pre-imported information, where the preprocessed map includes a cell distribution map and a pilot pollution distribution map, the actual engineering parameter table includes actual longitude information, actual latitude information, and actual azimuth information; obtaining selection information of a target area to determine the target area; and generating, for the target area, a map of abnormal cells of the target area according to the cell pilot identifiers and the signal strength corresponding to the pilot identifier of each test-marked cell. With the present invention, it is unnecessary to review test data and view the review connection, and the analysis efficiency is high.
Public/Granted literature
- US20130314432A1 METHOD AND APPARATUS FOR ANALYZING PILOT POLLUTION Public/Granted day:2013-11-28
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