Invention Grant
- Patent Title: Fabrication of low defectivity electrochromic devices
- Patent Title (中): 低缺陷电致变色器件的制造
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Application No.: US14536462Application Date: 2014-11-07
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Publication No.: US09477129B2Publication Date: 2016-10-25
- Inventor: Mark Kozlowski , Eric Kurman , Zhongchun Wang , Mike Scobey , Jeremy Dixon , Anshu Pradhan , Robert Rozbicki
- Applicant: View, Inc.
- Applicant Address: US CA Milpitas
- Assignee: View, Inc.
- Current Assignee: View, Inc.
- Current Assignee Address: US CA Milpitas
- Agency: Weaver Austin Villeneuve & Sampson LLP
- Agent Brian D. Griedel
- Main IPC: C23C14/00
- IPC: C23C14/00 ; G02F1/153 ; C03C17/34 ; C23C10/28 ; C23C14/08 ; C23C14/18 ; C23C14/56 ; C23C14/58 ; G02F1/15 ; B05D5/06 ; B23K20/10 ; C23C14/02 ; C23C14/04 ; C23C14/14 ; C23C14/34 ; G02F1/155

Abstract:
Prior electrochromic devices frequently suffer from high levels of defectivity. The defects may be manifest as pin holes or spots where the electrochromic transition is impaired. This is unacceptable for many applications such as electrochromic architectural glass. Improved electrochromic devices with low defectivity can be fabricated by depositing certain layered components of the electrochromic device in a single integrated deposition system. While these layers are being deposited and/or treated on a substrate, for example a glass window, the substrate never leaves a controlled ambient environment, for example a low pressure controlled atmosphere having very low levels of particles. These layers may be deposited using physical vapor deposition.
Public/Granted literature
- US20150060264A1 FABRICATION OF LOW DEFECTIVITY ELECTROCHROMIC DEVICES Public/Granted day:2015-03-05
Information query
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