Invention Grant
- Patent Title: Substrate etching method
- Patent Title (中): 基板蚀刻方法
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Application No.: US14646909Application Date: 2013-11-01
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Publication No.: US09478439B2Publication Date: 2016-10-25
- Inventor: Zhongwei Jiang
- Applicant: BEIJING NMC CO., LTD.
- Applicant Address: CN Beijing
- Assignee: BEIJING NMC CO., LTD.
- Current Assignee: BEIJING NMC CO., LTD.
- Current Assignee Address: CN Beijing
- Agency: Bracewell LLP
- Agent Brad Y. Chin
- Priority: CN201210482401 20121123
- International Application: PCT/CN2013/086420 WO 20131101
- International Announcement: WO2014/079315 WO 20140530
- Main IPC: H01L21/302
- IPC: H01L21/302 ; H01L21/3213 ; H01L21/3065 ; B81C1/00

Abstract:
Embodiments of the invention provide a substrate etching method, which includes: a deposition operation for depositing a polymer on a side wall of a silicon groove, an etching operation for etching the side wall of the silicon groove, and repeating the deposition operation and the etching operation at least twice. In the process of completing all cycles of the etching operation, a chamber pressure of a reaction chamber is decreased from a preset highest pressure to a preset lowest pressure according to a preset rule. The substrate etching method, according to various embodiments of the invention, avoid the problem of damaging the side wall, thereby making the side wall smooth.
Public/Granted literature
- US20150311091A1 SUBSTRATE ETCHING METHOD Public/Granted day:2015-10-29
Information query
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