Invention Grant
- Patent Title: Wafer to wafer structure and method of fabricating the same
- Patent Title (中): 晶圆晶片结构及其制造方法
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Application No.: US14945410Application Date: 2015-11-18
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Publication No.: US09478496B1Publication Date: 2016-10-25
- Inventor: Ming-Tse Lin
- Applicant: UNITED MICROELECTRONICS CORP.
- Applicant Address: TW Hsin-Chu
- Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee Address: TW Hsin-Chu
- Agent Winston Hsu; Scott Margo
- Priority: CN201510699989 20151026
- Main IPC: H01L21/30
- IPC: H01L21/30 ; H01L23/538 ; H01L21/768

Abstract:
A wafer to wafer structure includes a first wafer, a second wafer. A first bonding layer and a second bonding layer are disposed between the first wafer and the second wafer. A plurality of first interconnects are disposed within the he first bonding layer. A plurality of second interconnects are disposed within the second bonding layer. An interface is disposed between the first bonding layer and the second bonding layer. At least a through silicon via penetrates the first wafer, the first bonding layer and the interface to enter the second bonding layer. The through silicon via contacts one of the first interconnects and one of the second interconnects.
Information query
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