Invention Grant
- Patent Title: Method for processing a carrier, a carrier, and a split gate field effect transistor structure
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Application No.: US14927608Application Date: 2015-10-30
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Publication No.: US09478555B2Publication Date: 2016-10-25
- Inventor: Kerstin Kaemmer , Thomas Bertrams , Henning Feick , Olaf Storbeck , Matthias Schmeide
- Applicant: Infineon Technologies AG
- Applicant Address: DE Neubiberg
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Neubiberg
- Agency: Viering, Jentschura & Partner mbB
- Main IPC: H01L27/11
- IPC: H01L27/11 ; H01L27/112 ; H01L21/02 ; H01L29/51 ; H01L23/525 ; H01L29/423 ; H01L21/265 ; H01L21/28

Abstract:
According to various embodiments, a method for processing a carrier may include: doping a carrier with fluorine such that a first surface region of the carrier is fluorine doped and a second surface region of the carrier is at least one of free from the fluorine doping or less fluorine doped than the first surface region; and oxidizing the carrier to grow a first gate oxide layer from the first surface region of the carrier with a first thickness and simultaneously from the second surface region of the carrier with a second thickness different from the first thickness.
Public/Granted literature
- US20160049411A1 METHOD FOR PROCESSING A CARRIER, A CARRIER, AND A SPLIT GATE FIELD EFFECT TRANSISTOR STRUCTURE Public/Granted day:2016-02-18
Information query
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