Invention Grant
- Patent Title: Wavelength detector and wavelength calibration system
- Patent Title (中): 波长检测器和波长校准系统
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Application No.: US13535641Application Date: 2012-06-28
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Publication No.: US09478933B2Publication Date: 2016-10-25
- Inventor: Toru Suzuki , Shinichi Matsumoto
- Applicant: Toru Suzuki , Shinichi Matsumoto
- Applicant Address: JP Tochigi
- Assignee: GIGAPHOTON INC.
- Current Assignee: GIGAPHOTON INC.
- Current Assignee Address: JP Tochigi
- Agency: Kratz, Quintos & Hanson, LLP
- Priority: JP2011-150373 20110706; JP2012-113836 20120517
- Main IPC: H01S3/13
- IPC: H01S3/13 ; G01J1/42 ; H01S3/137 ; H01S3/225 ; G01J9/00 ; G01J9/02 ; H01J47/00 ; H01S3/08 ; H01S3/10

Abstract:
The wavelength detector includes a diffusion element that diffuses the laser beam; a light collection optical system provided downstream from the diffusion element; a member, including an aperture, provided downstream from the light collection optical system; a discharge tube that is provided downstream from the member and that includes a cylindrical anode and a cylindrical cathode that each have a through-hole formed therein, and that is configured so that an electrical property between the anode and the cathode changes due to an opto-galvanic effect when a laser beam having a predetermined wavelength passes through the through-hole of the cathode in a state in which a DC voltage is applied to the anode; and a high-voltage DC power source. The discharge tube is disposed so that the laser beam that passes through the aperture passes through the through-hole of the cathode of the discharge tube without directly irradiating the cathode.
Public/Granted literature
- US20130170508A1 WAVELENGTH DETECTOR AND WAVELENGTH CALIBRATION SYSTEM Public/Granted day:2013-07-04
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