Invention Grant
- Patent Title: Abnormality detection device
- Patent Title (中): 异常检测装置
-
Application No.: US14018152Application Date: 2013-09-04
-
Publication No.: US09482632B2Publication Date: 2016-11-01
- Inventor: Jun Yokoyama
- Applicant: NEC Corporation
- Applicant Address: JP Tokyo
- Assignee: NEC Corporation
- Current Assignee: NEC Corporation
- Current Assignee Address: JP Tokyo
- Agency: Wilmer Cutler Pickering Hale and Dorr LLP
- Priority: JP2012-194793 20120905
- Main IPC: G01N25/72
- IPC: G01N25/72 ; H05K7/20

Abstract:
An estimating unit 51 estimates the upper limit of possible temperatures in a predetermined position of ICT equipment when the quantity of intake air into the ICT equipment is appropriate, based on the result of detection by an operational status detecting unit that detects the operational status of the ICT equipment and the result of detection by an intake-air temperature sensor 62 that detects the temperature of intake air of the ICT equipment. A determining unit 52 determines that an abnormality is occurring when the result of detection by a temperature sensor 63 that detects the temperature in the predetermined position is beyond the upper limit estimated by the estimating unit.
Public/Granted literature
- US20140064321A1 ABNORMALITY DETECTION DEVICE Public/Granted day:2014-03-06
Information query