Invention Grant
- Patent Title: Reagent preparation apparatus and sample processing apparatus
- Patent Title (中): 试剂制备装置和样品处理装置
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Application No.: US13417886Application Date: 2012-03-12
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Publication No.: US09482682B2Publication Date: 2016-11-01
- Inventor: Yutaka Ikeda , Noriyuki Nakanishi
- Applicant: Yutaka Ikeda , Noriyuki Nakanishi
- Applicant Address: JP Hyogo
- Assignee: SYSMEX CORPORATION
- Current Assignee: SYSMEX CORPORATION
- Current Assignee Address: JP Hyogo
- Agency: Brinks Gilson & Lione
- Priority: JP2011-055629 20110314
- Main IPC: G01N35/00
- IPC: G01N35/00 ; G01N27/00 ; G01N33/50 ; G01N1/38

Abstract:
The present invention is a reagent preparation apparatus, comprising: a reagent preparation unit configured to prepare a reagent for processing a sample; a measuring unit configured to measure a property of the reagent prepared by the reagent preparation unit; a waste section configured to discard the prepared reagent when a measurement result by the measuring unit does not meet a predetermined condition; and a controller configured to control a reagent preparation operation of the reagent preparation unit, wherein the controller controls the reagent preparation unit to stop the reagent preparation operation when a number of times of discarding a reagent has reached a predetermined plurality of times.
Public/Granted literature
- US20120237400A1 REAGENT PREPARATION APPARATUS AND SAMPLE PROCESSING APPARATUS Public/Granted day:2012-09-20
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