Invention Grant
US09483068B2 Estimating and monitoring the effects of transistor aging 有权
估计和监测晶体管老化的影响

Estimating and monitoring the effects of transistor aging
Abstract:
One embodiment of the present invention sets for a method for monitoring the aging of a circuit. The method includes operating an aging unit included in the circuit beginning at a first time. The method also includes in response to a trigger event, operating a non-aging unit also included in the circuit beginning at a second time wherein the second time is subsequent to the first time. The method further includes detecting a frequency difference between a first frequency generated by the aging unit and a second frequency generated by the non-aging unit. The method also includes generating a modified power supply voltage based on the frequency difference. The method also includes applying the modified power supply voltage to the non-aging unit.
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