Invention Grant
- Patent Title: Estimating and monitoring the effects of transistor aging
- Patent Title (中): 估计和监测晶体管老化的影响
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Application No.: US13866969Application Date: 2013-04-19
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Publication No.: US09483068B2Publication Date: 2016-11-01
- Inventor: Tezaswi Raja , Andrew Charnas
- Applicant: NVIDIA CORPORATION
- Applicant Address: US CA Santa Clara
- Assignee: NVIDIA Corporation
- Current Assignee: NVIDIA Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Artegis Law Group, LLP
- Main IPC: G05F3/02
- IPC: G05F3/02 ; G01R31/26 ; H03K17/14 ; H03K19/003

Abstract:
One embodiment of the present invention sets for a method for monitoring the aging of a circuit. The method includes operating an aging unit included in the circuit beginning at a first time. The method also includes in response to a trigger event, operating a non-aging unit also included in the circuit beginning at a second time wherein the second time is subsequent to the first time. The method further includes detecting a frequency difference between a first frequency generated by the aging unit and a second frequency generated by the non-aging unit. The method also includes generating a modified power supply voltage based on the frequency difference. The method also includes applying the modified power supply voltage to the non-aging unit.
Public/Granted literature
- US20140312873A1 ESTIMATING AND MONITORING THE EFFECTS OF TRANSISTOR AGING Public/Granted day:2014-10-23
Information query
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