Invention Grant
- Patent Title: Realogram scene analysis of images: superpixel scene analysis
- Patent Title (中): 图像场景分析:超像素场景分析
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Application No.: US14641290Application Date: 2015-03-06
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Publication No.: US09483704B2Publication Date: 2016-11-01
- Inventor: Edward Schwartz
- Applicant: Edward Schwartz
- Applicant Address: JP Tokyo
- Assignee: RICOH CO., LTD.
- Current Assignee: RICOH CO., LTD.
- Current Assignee Address: JP Tokyo
- Agency: Patent Law Works LLP
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G06K9/46 ; G06K9/62 ; G06K9/52 ; G06K9/18 ; G06Q10/08 ; G06T7/40 ; G06K9/00

Abstract:
The techniques include an image recognition system to receive a realogram image including a plurality of organized objects and to detect and identify objects in the realogram image of one or more items on a retail shelf, identify shelf fronts and labels on the shelf fronts, identify empty space under shelves, identify areas where unidentified products may be, and identify areas where products are “out of stock”.
Public/Granted literature
- US20160171707A1 Realogram Scene Analysis of Images: Superpixel Scene Analysis Public/Granted day:2016-06-16
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