Invention Grant
- Patent Title: Decoding data using bit line defect information
- Patent Title (中): 使用位线缺陷信息对数据进行解码
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Application No.: US14812362Application Date: 2015-07-29
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Publication No.: US09484114B1Publication Date: 2016-11-01
- Inventor: Refael Ben-Rubi , Mark Shlick , Moshe Cohen
- Applicant: SANDISK TECHNOLOGIES INC.
- Applicant Address: US TX Plano
- Assignee: SANDISK TECHNOLOGIES LLC
- Current Assignee: SANDISK TECHNOLOGIES LLC
- Current Assignee Address: US TX Plano
- Agency: Toler Law Group, PC
- Main IPC: G11C29/04
- IPC: G11C29/04 ; G11C17/16 ; G11C7/00 ; G11C29/18 ; G11C29/26

Abstract:
A data storage device includes a memory including a plurality of storage elements configured to store data. The plurality of storage elements includes a first group of storage elements and a second group of storage elements. The data storage device further includes a selection module configured to retrieve first bit line defect information affecting the first group of storage elements and to retrieve second bit line defect information affecting the second group of storage elements.
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