Invention Grant
US09484114B1 Decoding data using bit line defect information 有权
使用位线缺陷信息对数据进行解码

Decoding data using bit line defect information
Abstract:
A data storage device includes a memory including a plurality of storage elements configured to store data. The plurality of storage elements includes a first group of storage elements and a second group of storage elements. The data storage device further includes a selection module configured to retrieve first bit line defect information affecting the first group of storage elements and to retrieve second bit line defect information affecting the second group of storage elements.
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