Invention Grant
- Patent Title: Field effect transistor contacts
- Patent Title (中): 场效应晶体管触点
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Application No.: US14812330Application Date: 2015-07-29
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Publication No.: US09484264B1Publication Date: 2016-11-01
- Inventor: Veeraraghavan S. Basker , Kangguo Cheng , Theodorus E. Standaert , Junli Wang
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee Address: US NY Armonk
- Agency: Cantor Colburn LLP
- Agent Vazken Alexanian
- Main IPC: H01L27/08
- IPC: H01L27/08 ; H01L29/06 ; H01L29/49 ; H01L21/8234 ; H01L27/088 ; H01L21/768 ; H01L21/311

Abstract:
A first field effect transistor (FET) device includes a first gate over a first channel region of a first fin arranged on a substrate, a second gate of a second FET device over a second channel region of a second fin arranged on the substrate, the second channel region having a width that is greater than a width of the first channel region, a first cavity that exposes an active region of the first FET device and a second cavity that exposes an active region of the second FET device, and a conductive material in the first cavity to define a first contact and a conductive material in the second cavity to define a second contact, the second contact having a width that is greater than a width of the first contact.
Information query
IPC分类: