An electronic test apparatus, such as an oscilloscope, comprising a logic analyzer frontend, wherein the logic analyzer frontend comprises a digital input port configured to receive a digital signal from a device under test. The logic analyzer frontend further comprises at least one analog-to-digital converter that is arranged downstream of the digital input port, and a digital comparator that is arranged downstream of the analog-to-digital converter. The digital comparator is configured to generate an adjusted digital signal and to provide the adjusted digital signal to further components of the electronic test apparatus. The logic analyzer frontend further comprises a digital correction unit configured to adjust a digital decision threshold value of the comparator.