Invention Grant
- Patent Title: Handler and inspection apparatus
- Patent Title (中): 处理器和检验仪器
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Application No.: US14200634Application Date: 2014-03-07
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Publication No.: US09485810B2Publication Date: 2016-11-01
- Inventor: Takayuki Imai , Haruhiko Miyamoto , Fuyumi Takata , Toshioki Shimojima
- Applicant: Seiko Epson Corporation
- Applicant Address: JP
- Assignee: Seiko Epson Corporation
- Current Assignee: Seiko Epson Corporation
- Current Assignee Address: JP
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: JP2013-090050 20130423
- Main IPC: H05B3/60
- IPC: H05B3/60 ; G01R31/28 ; H05B1/02

Abstract:
A handler includes: a rotating section which is a holding unit mounting section which can take a mounted state in which a holding unit for holding an IC device is mounted; and a transportation mechanism which transports the IC device held by the holding unit. The rotating section includes a heat generation section which generates heat and a heating flow path through which fluid which is heated by the heat generation section and is used for heating of the IC device passes.
Public/Granted literature
- US20140312924A1 HANDLER AND INSPECTION APPARATUS Public/Granted day:2014-10-23
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