Invention Grant
- Patent Title: Single particle detection device, single particle detection method, and computer program for single particle detection, using optical analysis
- Patent Title (中): 单粒子检测装置,单粒子检测方法和单粒子检测计算机程序,采用光学分析
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Application No.: US14162142Application Date: 2014-01-23
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Publication No.: US09488578B2Publication Date: 2016-11-08
- Inventor: Takuya Hanashi , Tetsuya Tanabe
- Applicant: OLYMPUS CORPORATION
- Applicant Address: JP Tokyo
- Assignee: OLYMPUS CORPORATION
- Current Assignee: OLYMPUS CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Westerman, Hattori, Daniels & Adrian, LLP
- Priority: JP2011-184635 20110826
- Main IPC: G01N21/64
- IPC: G01N21/64 ; G01N15/14 ; G01N21/51 ; G02B21/00

Abstract:
There is provided a single particle detection technique based on a scanning molecule counting method, enabling individual detection of a single particle using light measurement with a confocal or multiphoton microscope, and quantitative observation of conditions or characteristics of the particle. The inventive technique of detecting a single particle in a sample solution detects light containing substantially constant background light from a light detection region with moving the position of the light detection region of the microscope in a sample solution to generate time series light intensity data; and detects individually a light intensity reduction occurred when a single particle which does not emit light (or a particle whose emitting light intensity in a detected wavelength band is lower than the background light) enters in the light detection region in the time series light intensity data as a signal indicating the existence of each single particle.
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