Invention Grant
- Patent Title: Testing device and a circuit arrangement
- Patent Title (中): 测试装置和电路装置
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Application No.: US14326483Application Date: 2014-07-09
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Publication No.: US09488674B2Publication Date: 2016-11-08
- Inventor: Carlos Marques Martins , Steffen Thiele , Aron Theil
- Applicant: Infineon Technologies AG
- Applicant Address: DE Neubiberg
- Assignee: INFINEON TECHNOLOGIES AG
- Current Assignee: INFINEON TECHNOLOGIES AG
- Current Assignee Address: DE Neubiberg
- Main IPC: G01R1/04
- IPC: G01R1/04

Abstract:
A testing device in accordance with various embodiments may include: a plurality of first terminals configured to be connected to a plurality of devices-under-test, wherein each first terminal of the plurality of first terminals may be configured to be connected to a respective device-under-test of the plurality of devices-under-test; a signal interface configured to be connected to a tester; and a circuit configured to exchange an identical first signal with each device-under-test of the plurality of devices-under-test through a respective first terminal of the plurality of first terminals, and to exchange at least one interface signal with the tester through the signal interface.
Public/Granted literature
- US20160011232A1 TESTING DEVICE AND A CIRCUIT ARRANGEMENT Public/Granted day:2016-01-14
Information query