Invention Grant
- Patent Title: Semiconductor device
- Patent Title (中): 半导体器件
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Application No.: US14826788Application Date: 2015-08-14
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Publication No.: US09496334B2Publication Date: 2016-11-15
- Inventor: Hiroaki Yamashita , Syotaro Ono , Hideyuki Ura , Masahiro Shimura
- Applicant: Kabushiki Kaisha Toshiba
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: White & Case LLP
- Priority: JP2015-051709 20150316
- Main IPC: H01L29/06
- IPC: H01L29/06 ; H01L29/78 ; H01L29/40 ; H01L29/10 ; H01L29/08

Abstract:
A semiconductor device according to an embodiment includes a first semiconductor layer of a first conductivity type, second semiconductor regions of a second conductivity type, a third semiconductor region of the second conductivity type, a fourth semiconductor region of the first conductivity type, a gate electrode, an insulating layer, and a first electrode. The first semiconductor layer includes first semiconductor regions. The second semiconductor regions are provided respectively between the first semiconductor regions. The insulating layer is provided between the gate electrode and the third semiconductor region. The first electrode includes a first portion and a second portion. The first portion is connected to the first semiconductor region. The second portion is provided on the fourth semiconductor region side of the first portion. The first electrode is provided on the first semiconductor region and on the second semiconductor region. The first electrode is provided around the fourth semiconductor region.
Public/Granted literature
- US20160276427A1 SEMICONDUCTOR DEVICE Public/Granted day:2016-09-22
Information query
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