A system and method to inspect flaws associated with a part. The system includes a first image capturing device configured to capture a first set of images of the part and a computer operably associated with first image capturing device and configured to receive and analyze the first set of images. The method includes treating the part with a nital etchant solution, capturing a first set of images of an outer surface of the part with the first image capturing device, and identifying a part defect with an algorithm associated with the computer.