Invention Grant
US09502306B2 Pattern formation method that includes partially removing line and space pattern 有权
模式形成方法包括部分去除线和空格

Pattern formation method that includes partially removing line and space pattern
Abstract:
The present invention provides a pattern formation method of forming a pattern on a substrate by partially removing a line and space pattern formed on the substrate, comprising a first formation step of forming a first layer including a plurality of first openings on the line and space pattern, a second step of forming, on the first layer, a second layer including a second opening for exposing one or more first openings, which are used to partially remove the line and space pattern, among the plurality of first openings, and a removing step of partially removing the line and space pattern through the second opening and the first opening, wherein the plurality of first openings are located on a plurality of lines of the line and space pattern.
Public/Granted literature
Information query
Patent Agency Ranking
0/0