Invention Grant
- Patent Title: Pattern formation method that includes partially removing line and space pattern
- Patent Title (中): 模式形成方法包括部分去除线和空格
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Application No.: US14799897Application Date: 2015-07-15
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Publication No.: US09502306B2Publication Date: 2016-11-22
- Inventor: Koichiro Tsujita , Tadashi Arai
- Applicant: CANON KABUSHIKI KAISHA
- Applicant Address: JP Tokyo
- Assignee: CANON KABUSHIKI KAISHA
- Current Assignee: CANON KABUSHIKI KAISHA
- Current Assignee Address: JP Tokyo
- Agency: Rossi, Kimms & McDowell LLP
- Priority: JP2014-158123 20140801
- Main IPC: H01L21/027
- IPC: H01L21/027 ; H01L21/8238 ; H01L29/06 ; H01L21/3213 ; H01L21/311 ; H01L21/308 ; H01L27/02

Abstract:
The present invention provides a pattern formation method of forming a pattern on a substrate by partially removing a line and space pattern formed on the substrate, comprising a first formation step of forming a first layer including a plurality of first openings on the line and space pattern, a second step of forming, on the first layer, a second layer including a second opening for exposing one or more first openings, which are used to partially remove the line and space pattern, among the plurality of first openings, and a removing step of partially removing the line and space pattern through the second opening and the first opening, wherein the plurality of first openings are located on a plurality of lines of the line and space pattern.
Public/Granted literature
- US20160035628A1 PATTERN FORMATION METHOD Public/Granted day:2016-02-04
Information query
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