Invention Grant
- Patent Title: Method of applying edge offset
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Application No.: US14588036Application Date: 2014-12-31
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Publication No.: US09503758B2Publication Date: 2016-11-22
- Inventor: Min Jang
- Applicant: INFOBRIDGE PTE. LTD.
- Applicant Address: SG Singapore
- Assignee: INFOBRIDGE PTE. LTD.
- Current Assignee: INFOBRIDGE PTE. LTD.
- Current Assignee Address: SG Singapore
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Priority: KR10-2012-0005334 20120117
- Main IPC: H04N7/12
- IPC: H04N7/12 ; H04N19/86 ; H04N19/176 ; H04N19/117 ; H04N19/14 ; H04N19/124 ; H04N19/50 ; H04N19/114 ; H04N19/196 ; H04N19/593 ; H04N19/174

Abstract:
Provided is a method generates an edge index of a current sample, and applies an edge offset corresponding to the edge index to the current sample. The edge index is generated using the differences between a current sample and two neighboring samples determined by an edge offset type. Accordingly, the difference between original samples and reconstructed samples are effectively reduced by generating the optimum edge index. Also, the quantity of bits required for reducing the differences are reduced by fixing the sign of offset to positive or negative.
Public/Granted literature
- US20150110179A1 METHOD OF APPLYING EDGE OFFSET Public/Granted day:2015-04-23
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