Invention Grant
- Patent Title: Temperature compensated reverse current for memory
- Patent Title (中): 用于存储器的温度补偿反向电流
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Application No.: US14749460Application Date: 2015-06-24
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Publication No.: US09508446B1Publication Date: 2016-11-29
- Inventor: Chung-Kuang Chen , Yi-Ting Lai
- Applicant: MACRONIX INTERNATIONAL CO., LTD.
- Applicant Address: TW Hsinchu
- Assignee: MACRONIX INTERNATIONAL CO., LTD.
- Current Assignee: MACRONIX INTERNATIONAL CO., LTD.
- Current Assignee Address: TW Hsinchu
- Agency: Haynes Beffel & Wolfeld LLP
- Main IPC: G11C16/04
- IPC: G11C16/04 ; G11C16/28 ; G11C7/04 ; G11C7/12

Abstract:
One aspect of the technology is a memory device comprising a memory array, a sense circuit, and temperature compensated bias circuitry. The memory array is electrically coupled between a bit line bias circuit and a common source line. The bit line bias circuit generates a temperature compensated sense current through the memory array. The temperature compensated bias circuitry controls the bit line bias circuit to generate the temperature compensated sense current through the memory array.
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