Invention Grant
- Patent Title: Trench capacitors and methods of forming the same
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Application No.: US14724437Application Date: 2015-05-28
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Publication No.: US09508790B2Publication Date: 2016-11-29
- Inventor: Thomas Popp , Stefan Pompl , Rudolf Berger
- Applicant: Infineon Technologies AG
- Applicant Address: DE Neubiberg
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Neubiberg
- Agency: Slater Matsil, LLP
- Main IPC: H01L49/02
- IPC: H01L49/02 ; H01L27/08

Abstract:
A method of forming a semiconductor device includes forming an opening having a sidewall in a substrate and forming a first epitaxial layer in the opening. The first epitaxial layer is formed in a first portion of the sidewall without growing in a second portion of the sidewall. A second epitaxial layer is formed in the opening after forming the first epitaxial layer. The second epitaxial layer is formed in the second portion of the sidewall. The first epitaxial layer is removed after forming the second epitaxial layer.
Public/Granted literature
- US20150263083A1 Trench Capacitors and Methods of Forming the Same Public/Granted day:2015-09-17
Information query
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