Invention Grant
- Patent Title: High-side field effect transistor
- Patent Title (中): 高边场效应晶体管
-
Application No.: US14706002Application Date: 2015-05-07
-
Publication No.: US09508813B1Publication Date: 2016-11-29
- Inventor: Yen-Ming Chen , Chiuling Lee , Min-Hsuan Tsai , Zheng Hong Chen , Wei Hsuan Chang , Tseng-Hsun Liu
- Applicant: UNITED MICROELECTRONICS CORPORATION
- Applicant Address: TW Hsinchu
- Assignee: UNITED MICROELECTRONICS CORPORATION
- Current Assignee: UNITED MICROELECTRONICS CORPORATION
- Current Assignee Address: TW Hsinchu
- Agent Ding Yu Tan
- Main IPC: H01L29/423
- IPC: H01L29/423 ; H01L29/78 ; H01L29/66

Abstract:
The present invention provides a transistor comprising a substrate having a surface; a first deep well region in the substrate; a second deep well region in the substrate, isolated from and encircling the first deep well region; a first well region in the substrate and on the first deep well region; two second well regions in the second deep well region and respectively at two opposite sides of the first well region; a source region in the first well region and adjacent to the surface; two drain regions in the two second well regions respectively and adjacent to the surface; two gate structures on the surface, wherein each of the two gate structures is between the source region and one of the drain regions respectively; and a guard ring in the substrate encircling the second deep well region, and on the periphery of the transistor.
Public/Granted literature
- US20160329408A1 HIGH-SIDE FIELD EFFECT TRANSISTOR Public/Granted day:2016-11-10
Information query
IPC分类: