Invention Grant
- Patent Title: Device for measuring sound level
- Patent Title (中): 声级测量装置
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Application No.: US14519206Application Date: 2014-10-21
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Publication No.: US09510117B2Publication Date: 2016-11-29
- Inventor: Wieslaw Barwicz , Ryszard Leoniak , Lukasz Lukaszewski , Grzegorz Kuzmiszyn
- Applicant: SVANTEK Sp. z o.o
- Applicant Address: PL Warsaw
- Assignee: SVANTEK SP. ZO.O.
- Current Assignee: SVANTEK SP. ZO.O.
- Current Assignee Address: PL Warsaw
- Agent Mark M. Friedman
- Priority: EP13461555 20131030
- Main IPC: H04R19/04
- IPC: H04R19/04 ; H04R29/00 ; H04R1/20 ; H04R1/22 ; H04R19/00

Abstract:
A device for measuring sound level, comprising: an inlet opening; a MEMS microphone for measuring sound level; and an external acoustic attenuator with a pressure divider comprising: a first branch between the inlet opening and the membrane of the MEMS microphone via an inlet channel and a resonant cavity; and a second branch between the resonant cavity and a vent chamber via a vent channel.
Public/Granted literature
- US20150139432A1 DEVICE FOR MEASURING SOUND LEVEL Public/Granted day:2015-05-21
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