Invention Grant
- Patent Title: Fluoroscopic image density correction method, non-destructive inspection method, and image processing device
- Patent Title (中): 透视图像浓度校正方法,无损检测方法和图像处理装置
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Application No.: US14705939Application Date: 2015-05-06
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Publication No.: US09524546B2Publication Date: 2016-12-20
- Inventor: Makiko Nagashima , Yasunori Narukawa
- Applicant: FUJIFILM Corporation
- Applicant Address: JP Tokyo
- Assignee: FUJIFILM Corporation
- Current Assignee: FUJIFILM Corporation
- Current Assignee Address: JP Tokyo
- Agency: Jianq Chyun IP Office
- Priority: JP2012-255455 20121121
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G01B15/02 ; G01N23/04 ; G01N21/954

Abstract:
A reference density profile is generated in an outer circumference direction of a pipe having a reference welded portion on the basis of a reference fluoroscopic image generated from a radiation detection medium when a radiation source is disposed on a central axis of the pipe. A weld inspection density profile is generated in an outer circumference direction of a pipe having an inspection target welded portion on the basis of a weld inspection fluoroscopic image. On the basis of the reference density profile and the weld inspection density profile, density correction information is calculated. The density correction information is for correcting density irregularities in the weld inspection fluoroscopic image in the outer circumference direction of the pipe. On the basis of the density correction information, the density irregularities in the weld inspection fluoroscopic image are corrected.
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