Resistive random-access memory (RRAM) devices and methods of manufacturing thereof are disclosed. A device comprises a first transparent conducting oxide (TCO) layer and a second TCO layer over the first TCO layer. The device further comprises a first dielectric layer between the first TCO layer and the second TCO layer, a second dielectric layer between the second TCO layer and the first dielectric layer, and a metal layer between the first dielectric layer and the second dielectric layer.