Invention Grant
- Patent Title: Fault detection and method of detecting faults in digital imaging systems
- Patent Title (中): 数字成像系统故障检测及故障检测方法
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Application No.: US14521751Application Date: 2014-10-23
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Publication No.: US09525865B2Publication Date: 2016-12-20
- Inventor: Rajat Sagar
- Applicant: Texas Instruments Incorporated
- Applicant Address: US TX Dallas
- Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee Address: US TX Dallas
- Agent Ronald O. Neerings; Frank D. Cimino
- Main IPC: H04N17/00
- IPC: H04N17/00 ; H04N5/232 ; H04N5/238
Abstract:
A method of analyzing a digital camera includes generating first image data using an image sensor in the camera. A first analysis is performed on at least one portion of the first image data. Second image data is generated using the image sensor and a second analysis is performed on the at least one portion of the second image data. The results of the first analysis are compared to the results of the second analysis. A signal indicating a fault with the digital camera is generated in response to the first analysis differing from the second analysis by a predetermined amount.
Public/Granted literature
- US20160119617A1 FAULT DETECTION AND METHOD OF DETECTING FAULTS IN DIGITAL IMAGING SYSTEMS Public/Granted day:2016-04-28
Information query
