Invention Grant
- Patent Title: Nitride semiconductor device and method of manufacturing the same
- Patent Title (中): 氮化物半导体器件及其制造方法
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Application No.: US14582468Application Date: 2014-12-24
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Publication No.: US09530858B2Publication Date: 2016-12-27
- Inventor: Akihisa Terano , Tomonobu Tsuchiya , Naoki Kaneda , Tomoyoshi Mishima
- Applicant: Sumitomo Chemical Company, Limited
- Applicant Address: JP Tokyo
- Assignee: Sumitomo Chemical Company, Limited
- Current Assignee: Sumitomo Chemical Company, Limited
- Current Assignee Address: JP Tokyo
- Agency: Crowell & Moring LLP
- Priority: JP2013-267517 20131225
- Main IPC: H01L29/15
- IPC: H01L29/15 ; H01L31/0256 ; H01L29/66 ; H01L29/20 ; H01L29/732 ; H01L29/737 ; H01L29/08

Abstract:
Disclosed are an npn-type bipolar transistor as a nitride semiconductor device having good characteristics, and a method of manufacturing the same. A so-called pn epitaxial substrate has a structure wherein an n-type collector layer and a p-type base layer of a three-layer structure are provided over a substrate. The three-layer structure includes first (lower layer side), second, and third (upper layer side) p-type base layers which differ in thickness and p-type impurity concentration. In a partial region inside the second p-type base layer located as an intermediate layer in the p-type base layer of the three-layer structure, an n-type emitter region is formed by ion implantation.
Public/Granted literature
- US20150179780A1 Nitride Semiconductor Device and Method of Manufacturing the Same Public/Granted day:2015-06-25
Information query
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