Invention Grant
- Patent Title: Apparatus and method for lesion detection
- Patent Title (中): 用于病变检测的装置和方法
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Application No.: US14495545Application Date: 2014-09-24
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Publication No.: US09532762B2Publication Date: 2017-01-03
- Inventor: Baek Hwan Cho , Yeong Kyeong Seong , Ye Hoon Kim
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: Jefferson IP Law, LLP
- Priority: KR10-2014-0019265 20140219
- Main IPC: G06K9/00
- IPC: G06K9/00 ; A61B6/00 ; G06K9/62 ; A61B8/08

Abstract:
An apparatus and a method for lesion detection are provided. The method of lesion detection involves detecting lesion candidates from a medical image, detecting anatomical objects from the medical image, verifying each of the lesion candidate based on anatomical context information comprising information regarding a location relationship between the lesion candidates and the anatomical objects, and removing one or more false positive lesion candidate from the detected lesion candidates based on a verification result.
Public/Granted literature
- US20150230773A1 APPARATUS AND METHOD FOR LESION DETECTION Public/Granted day:2015-08-20
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