Invention Grant
- Patent Title: Multi-headed imaging probe and imaging system using same
- Patent Title (中): 多头成像探头和使用它的成像系统
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Application No.: US13913124Application Date: 2013-06-07
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Publication No.: US09532768B2Publication Date: 2017-01-03
- Inventor: Jean-Michel Marteau , Aurelie Roncaglioni , Lionel Wodecki
- Applicant: General Electric Company
- Applicant Address: US NY Schenectady
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Schenectady
- Agency: The Small Patent Law Group, LLC
- Agent Dean D. Small
- Main IPC: A61B8/00
- IPC: A61B8/00 ; A61B8/08

Abstract:
A diagnostic imaging system is provided that includes an image acquisition component, a transmitter operatively coupled to the image acquisition component to transmit a signal therefrom, and a beamformer operatively coupled to the image acquisition component to receive image data therefrom. Also included is a processor configured to assemble images from the acquired image data and a display configured to display the images. The image acquisition component includes a multi-headed probe that has a plurality of transducers configured to permit a change of active transducers during an imaging session without a change of the image acquisition component.
Public/Granted literature
- US20170007204A9 MULTI-HEADED IMAGING PROBE AND IMAGING SYSTEM USING SAME Public/Granted day:2017-01-12
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