Invention Grant
- Patent Title: Measuring apparatus and fluorescence measuring method
- Patent Title (中): 测量装置和荧光测量方法
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Application No.: US14801012Application Date: 2015-07-16
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Publication No.: US09535007B2Publication Date: 2017-01-03
- Inventor: Toshiyuki Hattori
- Applicant: OLYMPUS CORPORATION
- Applicant Address: JP Tokyo
- Assignee: OLYMPUS CORPORATION
- Current Assignee: OLYMPUS CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Holtz, Holtz & Volek PC
- Priority: JP2014-147801 20140718
- Main IPC: G01N21/64
- IPC: G01N21/64 ; G01N21/27

Abstract:
A low-noise fluorescence image and a low-noise luminescence image are acquired even if a luminescent substance having a high luminescence level is used. Provided is a measuring apparatus including an illumination optical system that radiates excitation light coming from an excitation light source onto a specimen A, an image acquisition portion that acquires an image by measuring light generated at the specimen, and an image processing portion that, based on a first image, which is acquired by the image acquisition portion without radiating the excitation light, and a second image, which is acquired by the image acquisition portion while radiating the excitation light, generates a fluorescence image by removing a luminescence component from the second image.
Public/Granted literature
- US20160018332A1 MEASURING APPARATUS AND FLUORESCENCE MEASURING METHOD Public/Granted day:2016-01-21
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