Invention Grant
- Patent Title: Sample processing system and controlling method of the same
- Patent Title (中): 样品处理系统及其控制方法
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Application No.: US12589908Application Date: 2009-10-29
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Publication No.: US09535079B2Publication Date: 2017-01-03
- Inventor: Hiroyuki Tanaka
- Applicant: Hiroyuki Tanaka
- Applicant Address: JP Kobe
- Assignee: SYSMEX CORPORATION
- Current Assignee: SYSMEX CORPORATION
- Current Assignee Address: JP Kobe
- Agency: Brinks Gilson & Lione
- Priority: JP2008-280311 20081030
- Main IPC: G01N35/04
- IPC: G01N35/04 ; G01N35/02 ; G01N35/00

Abstract:
A sample processing system is disclosed that comprises: a transportation apparatus configured to convey a sample container; a first analyzer, arranged along the transportation apparatus, configured to measure a sample accommodated in a sample container conveyed by the transportation apparatus; a second analyzer, arranged along the transportation apparatus, configured to measure a sample accommodated in a sample container conveyed by the transportation apparatus; and a transportation controller configured to determine an analyzer to which a sample container is conveyed, and to control the transportation apparatus to convey the sample container to the determined analyzer, wherein: the first analyzer is configured to conduct primary measurement; and the second analyzer is configured to conduct both primary measurement and review measurement.
Public/Granted literature
- US20100112703A1 Sample processing system and controlling method of the same Public/Granted day:2010-05-06
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