Invention Grant
- Patent Title: Signal detection circuit and scanning probe microscope
- Patent Title (中): 信号检测电路和扫描探针显微镜
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Application No.: US14779622Application Date: 2014-03-04
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Publication No.: US09535088B2Publication Date: 2017-01-03
- Inventor: Takeshi Fukuma , Kazuki Miyata
- Applicant: NATIONAL UNIVERSITY CORPORATION KANAZAWA UNIVERSITY
- Applicant Address: JP Ishikawa
- Assignee: NATIONAL UNIVERSITY CORPORATION KANAZAWA UNIVERSITY
- Current Assignee: NATIONAL UNIVERSITY CORPORATION KANAZAWA UNIVERSITY
- Current Assignee Address: JP Ishikawa
- Agency: Wenderoth, Lind & Ponack, L.L.P.
- Priority: JP2013-070575 20130328
- International Application: PCT/JP2014/001198 WO 20140304
- International Announcement: WO2014/155983 WO 20141002
- Main IPC: G01Q60/32
- IPC: G01Q60/32 ; G01Q20/00 ; H03D3/00 ; H03D7/16 ; G01Q10/06

Abstract:
A signal detection circuit includes: a VCO that generates a reference signal; a complex signal generation circuit that generates a complex signal from an input signal and the reference signal; a vector operation circuit that calculates an argument of the complex signal by performing a vector operation; and a subtracting phase comparator that compares the argument with a phase of the reference signal by calculating a difference between the argument and the phase of the reference signal, wherein the complex signal generation circuit includes: a multiplication circuit that multiplies the input signal by the reference signal; and an HPF that removes a DC component from a signal output from the multiplication circuit.
Public/Granted literature
- US20160047841A1 SIGNAL DETECTION CIRCUIT AND SCANNING PROBE MICROSCOPE Public/Granted day:2016-02-18
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