Invention Grant
US09535094B2 Vertical/horizontal probe system and calibration kit for the probe system
有权
探头系统的垂直/水平探头系统和校准套件
- Patent Title: Vertical/horizontal probe system and calibration kit for the probe system
- Patent Title (中): 探头系统的垂直/水平探头系统和校准套件
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Application No.: US14514926Application Date: 2014-10-15
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Publication No.: US09535094B2Publication Date: 2017-01-03
- Inventor: Wansoo Nah , Tae Ho Kim , Jong Hyeon Kim
- Applicant: Research & Business Foundation SUNGKYUNKWAN UNIVERSITY
- Applicant Address: KR Suwon-si
- Assignee: Research & Business Foundation SUNGKYUNKWAN UNIVERSITY
- Current Assignee: Research & Business Foundation SUNGKYUNKWAN UNIVERSITY
- Current Assignee Address: KR Suwon-si
- Agency: NSIP Law
- Priority: KR10-2013-0123855 20131017; KR10-2014-0077534 20140624
- Main IPC: G01R31/26
- IPC: G01R31/26 ; G01R1/073 ; G01R35/00 ; G01R27/06 ; G01R1/067

Abstract:
Disclosed is a probe system. The probe system includes a support member configured to grasp a circuit board to be tested vertically to a base plate, a probe-tip member having a probes that are in contact with a conductive pattern of the circuit board, a guide-arm member coupled with the probe-tip member and configured to move the probe-tip member to a desired position, and a network analyzer electrically connected with the probe of the probe-tip member and configured to analyze electromagnetic characteristics of the conductive pattern. Further disclosed is a calibration kit which that is applicable when calibrating a multi-port of the network analyzer using the probe system that is disclosed.
Public/Granted literature
- US20150168446A1 VERTICAL/HORIZONTAL PROBE SYSTEM AND CALIBRATION KIT FOR THE PROBE SYSTEM Public/Granted day:2015-06-18
Information query