Invention Grant
US09535094B2 Vertical/horizontal probe system and calibration kit for the probe system 有权
探头系统的垂直/水平探头系统和校准套件

Vertical/horizontal probe system and calibration kit for the probe system
Abstract:
Disclosed is a probe system. The probe system includes a support member configured to grasp a circuit board to be tested vertically to a base plate, a probe-tip member having a probes that are in contact with a conductive pattern of the circuit board, a guide-arm member coupled with the probe-tip member and configured to move the probe-tip member to a desired position, and a network analyzer electrically connected with the probe of the probe-tip member and configured to analyze electromagnetic characteristics of the conductive pattern. Further disclosed is a calibration kit which that is applicable when calibrating a multi-port of the network analyzer using the probe system that is disclosed.
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