Invention Grant
US09535102B2 Test signal supplying device and semiconductor integrated circuit 有权
测试信号提供器件和半导体集成电路

Test signal supplying device and semiconductor integrated circuit
Abstract:
A test signal supplying device includes a first external terminal, a second external terminal being applied with a predetermined electric potential, an internal load, a first terminal that is connected to the first external terminal through the internal load, a second terminal that is connected to the first external terminal without passing through the internal load, a test signal generating section that generates a test signal and supplies the test signal to the second terminal, a detecting section that detects an amplitude of the test signal, and a controlling section that measures an impedance of an external load connected to the first and second external terminals based on the detected amplitude of the test signal.
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