Invention Grant
- Patent Title: Test signal supplying device and semiconductor integrated circuit
- Patent Title (中): 测试信号提供器件和半导体集成电路
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Application No.: US13895837Application Date: 2013-05-16
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Publication No.: US09535102B2Publication Date: 2017-01-03
- Inventor: Kunito Takahashi , Akihiko Toda , Tatsuya Kishii
- Applicant: Yamaha Corporation
- Applicant Address: JP Hamamatsu-shi
- Assignee: Yamaha Corporation
- Current Assignee: Yamaha Corporation
- Current Assignee Address: JP Hamamatsu-shi
- Agency: Crowell & Moring LLP
- Priority: JP2012-113383 20120517; JP2012-113384 20120517
- Main IPC: G01R27/28
- IPC: G01R27/28 ; G01R27/02 ; H04R29/00 ; G01R31/28

Abstract:
A test signal supplying device includes a first external terminal, a second external terminal being applied with a predetermined electric potential, an internal load, a first terminal that is connected to the first external terminal through the internal load, a second terminal that is connected to the first external terminal without passing through the internal load, a test signal generating section that generates a test signal and supplies the test signal to the second terminal, a detecting section that detects an amplitude of the test signal, and a controlling section that measures an impedance of an external load connected to the first and second external terminals based on the detected amplitude of the test signal.
Public/Granted literature
- US20130307561A1 Test Signal Supplying Device and Semiconductor Integrated Circuit Public/Granted day:2013-11-21
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