Invention Grant
- Patent Title: Inspection apparatus and inspection method
- Patent Title (中): 检验仪器和检验方法
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Application No.: US14505632Application Date: 2014-10-03
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Publication No.: US09535108B2Publication Date: 2017-01-03
- Inventor: Yoshiyuki Fukami
- Applicant: Kabushiki Kaisha Nihon Micronics
- Applicant Address: JP Tokyo
- Assignee: KABUSHIKI KAISHA NIHON MICRONICS
- Current Assignee: KABUSHIKI KAISHA NIHON MICRONICS
- Current Assignee Address: JP Tokyo
- Agency: Leydig, Voit & Mayer, Ltd.
- Priority: JP2013-217515 20131018
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G01R31/04 ; G01R27/26 ; H05K1/02 ; H05K1/03 ; H05K1/11 ; H05K3/46 ; G01R31/02

Abstract:
An inspection apparatus for inspecting an inspection object. The inspection object includes a base body and wiring passing through the base body. The inspection apparatus includes an insulating substrate, a first electrode in the substrate with a portion of the first electrode exposed from a surface of the substrate to form a connection portion which may be electrically connected with the wiring, and a second electrode in the substrate. The first electrode and the second electrode are spaced apart, have mutually parallel portions, and are electrically insulated from each other.
Public/Granted literature
- US20150108997A1 INSPECTION APPARATUS AND INSPECTION METHOD Public/Granted day:2015-04-23
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