A fault detection assembly of an integrated circuit having a supply port, an input port and a ground port. The fault detection assembly includes a first diode connected with one end to the supply port and connected with the other end to the input port, a second diode connected with one end to the input port and connected with the other end to the ground port, at least a first fault detection transistor of MOS type. At least one of first and second diodes includes a first diode-connected MOS transistor whose gate is connected to the gate of the first fault detection transistor.