Invention Grant
- Patent Title: Testing device
- Patent Title (中): 测试装置
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Application No.: US14092534Application Date: 2013-11-27
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Publication No.: US09535114B2Publication Date: 2017-01-03
- Inventor: Choon Leong Lou , Ho Yeh Chen , Hsiao Ting Tseng
- Applicant: STAR TECHNOLOGIES, INC.
- Applicant Address: TW Hsinchu
- Assignee: STAR TECHNOLOGIES, INC.
- Current Assignee: STAR TECHNOLOGIES, INC.
- Current Assignee Address: TW Hsinchu
- Agency: WPAT, P.C., Intellectual Property Attorneys
- Agent Anthony King
- Main IPC: G01R1/067
- IPC: G01R1/067 ; G01R31/28 ; G01R31/26 ; G01R1/073
Abstract:
A testing device comprises a first probe member, a second probe member, and an insulation member. The first probe member comprises a tip portion for contacting a device being tested. The second probe member also comprises a tip portion for contacting the device being tested. The insulation member is located at or can be moved to a location between the tip portions of the first and second probe members.
Public/Granted literature
- US20140145740A1 TESTING DEVICE Public/Granted day:2014-05-29
Information query
