Invention Grant
- Patent Title: Metric catalog system
- Patent Title (中): 公制目录系统
-
Application No.: US13929781Application Date: 2013-06-28
-
Publication No.: US09535970B2Publication Date: 2017-01-03
- Inventor: Mayur Belur Mohan
- Applicant: Mayur Belur Mohan
- Applicant Address: DE Walldorf
- Assignee: SAP SE
- Current Assignee: SAP SE
- Current Assignee Address: DE Walldorf
- Main IPC: G06F7/00
- IPC: G06F7/00 ; G06F17/00 ; G06F17/30

Abstract:
A repository stores a metric catalog. The metric catalog represents a slice of multidimensional data source. The metric catalog includes a selected measure, at least one analysis dimension, and at least one fixed dimension. A metric catalog system exposes the metric catalog as a web service. A web service client requests to consume the metric catalog. In response to the request, the metric catalog system parses the metric catalog. Based on the parsed metric catalog, one or more queries are generated and executed. Based on the execution of the queries, values of the selected measure for the at least one analysis dimension are determined. The determined values of the selected measure for the at least one analysis dimension is returned to the web service client.
Public/Granted literature
- US20150006470A1 METRIC CATALOG SYSTEM Public/Granted day:2015-01-01
Information query