Invention Grant
- Patent Title: Resistive memory device and operating method
- Patent Title (中): 电阻式存储器件及操作方法
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Application No.: US14806780Application Date: 2015-07-23
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Publication No.: US09536605B2Publication Date: 2017-01-03
- Inventor: Hyun-Kook Park , Yeong-Taek Lee , Dae-Seok Byeon , Bo-Geun Kim
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Volentine & Whitt, PLLC
- Priority: KR10-2014-0148456 20141029
- Main IPC: G11C11/00
- IPC: G11C11/00 ; G11C13/00 ; G11C11/56 ; G11C11/16

Abstract:
Provided are a resistive memory device including a plurality of memory cells, and a method of operating the resistive memory device. The resistive memory device includes a sensing circuit connected to a first signal line, to which a memory cell is connected, the sensing circuit sensing data stored in the memory cell based on a first reference current; and a reference time generator for generating a reference time signal that determines a time point when a result of the sensing is to be output, based on the first reference current.
Public/Granted literature
- US20160125939A1 RESISTIVE MEMORY DEVICE AND OPERATING METHOD Public/Granted day:2016-05-05
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