Invention Grant
- Patent Title: Duty cycle detection circuit and semiconductor apparatus including the same
- Patent Title (中): 占空比检测电路和包括其的半导体装置
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Application No.: US14625970Application Date: 2015-02-19
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Publication No.: US09537490B2Publication Date: 2017-01-03
- Inventor: Da In Im , Young Suk Seo
- Applicant: SK hynix Inc.
- Applicant Address: KR Icheon-Si
- Assignee: SK HYNIX INC.
- Current Assignee: SK HYNIX INC.
- Current Assignee Address: KR Icheon-Si
- Agency: William Park & Associates Ltd.
- Priority: KR10-2014-0186088 20141222
- Main IPC: H03L7/06
- IPC: H03L7/06 ; H03L7/08 ; H03K5/156

Abstract:
A duty cycle detection circuit may include a detection block configured to generate a duty detection signal by detecting a duty cycle of an input clock; and a current amount control block configured to control a current flowing through the detection block in response to the input clock, regardless of a variation in a frequency of the input clock.
Public/Granted literature
- US20160182060A1 DUTY CYCLE DETECTION CIRCUIT AND SEMICONDUCTOR APPARATUS INCLUDING THE SAME Public/Granted day:2016-06-23
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