Invention Grant
US09537499B2 Circuit and method for comparator offset error detection and correction in an ADC
有权
ADC中比较器偏移误差检测和校正的电路和方法
- Patent Title: Circuit and method for comparator offset error detection and correction in an ADC
- Patent Title (中): ADC中比较器偏移误差检测和校正的电路和方法
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Application No.: US15048516Application Date: 2016-02-19
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Publication No.: US09537499B2Publication Date: 2017-01-03
- Inventor: Pieter Harpe
- Applicant: Stichting IMEC Nederland
- Applicant Address: NL Eindhoven
- Assignee: Stichting IMEC Nederland
- Current Assignee: Stichting IMEC Nederland
- Current Assignee Address: NL Eindhoven
- Agency: McDonnell Boehnen Hulbert & Berghoff LLP
- Priority: EP15155750 20150219; EP15165432 20150428
- Main IPC: H03M1/10
- IPC: H03M1/10 ; H03M1/46

Abstract:
A method includes sampling an input voltage signal applied to an ADC, comparing the sampled input voltage signal with an output signal of a feedback DAC, and determining in a search logic block a digital code representation for the comparison result. The method may also include performing a calibration by: performing an additional cycle, wherein a last comparison carried out for determining a least significant bit of the digital code representation is repeated with a second comparator resolution mode different from a first comparator resolution mode, so obtaining an additional comparison; determining from a difference between results of the additional comparison and the last comparison a sign of a comparator offset error between the comparator resolution modes; and tuning, in accordance with a sign of the comparator offset error, a programmable capacitor connected at an input of the comparator, thereby inducing a voltage step to counteract the comparator offset error.
Public/Granted literature
- US20160248435A1 Circuit and Method for Comparator Offset Error Detection and Correction in an ADC Public/Granted day:2016-08-25
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