Invention Grant
- Patent Title: Method and apparatus for calibration of a time interleaved ADC
- Patent Title (中): 用于校准时间交错ADC的方法和装置
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Application No.: US14858793Application Date: 2015-09-18
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Publication No.: US09537502B2Publication Date: 2017-01-03
- Inventor: Josephus Van Engelen , Aaron Buchwald , Ralph Duncan
- Applicant: Luxtera, Inc.
- Applicant Address: US CA Carlsbad
- Assignee: Entropic Communications, LLC
- Current Assignee: Entropic Communications, LLC
- Current Assignee Address: US CA Carlsbad
- Agency: McAndrews, Held & Malloy
- Main IPC: H03M1/06
- IPC: H03M1/06 ; H03M1/38 ; H03M1/12 ; H03M1/08 ; H03M1/14

Abstract:
A system for calibrating time interleaved ADCs is disclosed and may include a time interleaved analog-to-digital converter (ADC) for converting analog signals to digital signals, the time interleaved ADC comprising: a plurality of active slices, and a plurality of reference slices, each reference slice associated with a corresponding one of the plurality of active slices. An output of each reference slice may be used to correct distortion in an output of the corresponding active slice. Each active slice may sample an input signal at a first rate and each associated reference slice may sample the input signal at a second rate, the second rate being slower than the first rate. Each sample taken by one of the plurality of reference slices may then be taken concurrent with a sample taken by the associated active slice. Each reference slice may include a reference sampling module and a dummy load.
Public/Granted literature
- US20160191071A1 METHOD AND APPARATUS FOR CALIBRATION OF A TIME INTERLEAVED ADC Public/Granted day:2016-06-30
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