Invention Grant
US09538169B2 Quality test device for inspecting vehicular display module having thin-film transistors
有权
用于检查具有薄膜晶体管的车载显示模块的质量测试装置
- Patent Title: Quality test device for inspecting vehicular display module having thin-film transistors
- Patent Title (中): 用于检查具有薄膜晶体管的车载显示模块的质量测试装置
-
Application No.: US14531042Application Date: 2014-11-03
-
Publication No.: US09538169B2Publication Date: 2017-01-03
- Inventor: Christopher Adams
- Applicant: DENSO International America, Inc.
- Applicant Address: US MI Southfield
- Assignee: Denso International America, Inc.
- Current Assignee: Denso International America, Inc.
- Current Assignee Address: US MI Southfield
- Agency: Harness, Dickey & Pierce, P.L.C.
- Main IPC: G06T7/00
- IPC: G06T7/00 ; H04N17/00 ; G09G3/00 ; G09G3/36
Abstract:
A quality test device tests a display device having a plurality of thin film transistors (TFTs). The quality test device includes a color analyzer for determining a color of an image displayed by the display device, and a quality inspection module. The quality inspection module controls a display state of the display device and determines whether the TFTs are adequately disposed within the display device based on a performance threshold. The quality inspection module determines that the display device is defective when a performance data of the display device is outside of the performance threshold, and determines that the display device is normal when the performance data is within the performance threshold.
Public/Granted literature
- US20160125582A1 QUALITY TEST DEVICE FOR INSPECTING VEHICULAR DISPLAY MODULE HAVING THIN-FILM TRANSISTORS Public/Granted day:2016-05-05
Information query
