Invention Grant
- Patent Title: Optical measurement device and a method for an optical measurement
- Patent Title (中): 光学测量装置和光学测量方法
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Application No.: US13884509Application Date: 2012-01-05
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Publication No.: US09538927B2Publication Date: 2017-01-10
- Inventor: Visit Thaveeprungsriporn , Md. Irwan bin Md. Kassim
- Applicant: Visit Thaveeprungsriporn , Md. Irwan bin Md. Kassim
- Applicant Address: JP Osaka
- Assignee: Nitto Denko Corporation
- Current Assignee: Nitto Denko Corporation
- Current Assignee Address: JP Osaka
- Agency: Osha Liang LLP
- International Application: PCT/SG2012/000005 WO 20120105
- International Announcement: WO2012/099537 WO 20120726
- Main IPC: A61B5/1455
- IPC: A61B5/1455 ; A61B5/0295 ; G01N21/31 ; A61B5/024 ; A61B5/00

Abstract:
A reflectance-based optical measurement device and a method for a reflectance-based optical measurement are provided. The device comprises an illumination and detection assembly configured to output light to a surface portion of a user for measurement and to detect the output light reflected from said surface portion of the user as a signal; a coupling member configured for coupling in a cableless configuration to a personal mobile processing device; a measurement surface configured to allow access to said measurement surface by the surface portion of the user; wherein said access is provided by the optical device being holderless such that the surface portion of the user is allowed access to said measurement surface from all directions in a single plane; and further wherein said coupling member is arranged to transmit the detected signal to the personal mobile processing device.
Public/Granted literature
- US20130296673A1 OPTICAL MEASUREMENT DEVICE AND A METHOD FOR AN OPTICAL MEASUREMENT Public/Granted day:2013-11-07
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