Invention Grant
- Patent Title: Structural illumination and evanescent coupling for the extension of imaging interferometric microscopy
- Patent Title (中): 用于成像干涉显微镜扩展的结构照明和ev逝耦合
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Application No.: US14230582Application Date: 2014-03-31
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Publication No.: US09541374B2Publication Date: 2017-01-10
- Inventor: Steven R.J. Brueck , Yuliya Kuznetsova , Alexander Neumann
- Applicant: Steven R.J. Brueck , Yuliya Kuznetsova , Alexander Neumann
- Applicant Address: US NM Albuquerque
- Assignee: STC.UNM
- Current Assignee: STC.UNM
- Current Assignee Address: US NM Albuquerque
- Agency: MH2 Technology Law Group LLP
- Main IPC: G02B21/06
- IPC: G02B21/06 ; G02B21/00 ; G01B9/02 ; G02B21/36 ; G06T3/40 ; G02B21/18 ; G01B9/04 ; G01N21/65

Abstract:
In accordance with the aspects of the present disclosure, a method and apparatus is disclosed for three-dimensional imaging interferometric microscopy (IIM), which can use at least two wavelengths to image a three-dimensional object. The apparatus can include a first, a second, and a third optical system. The first optical system is disposed to provide a substantially coherent illumination to the 3D object, wherein the illumination is characterized by a plurality of wavelengths. The second optical system includes an optical image recording device and one or more additional optical components characterized by a numerical aperture NA. The third optical system provides interferometric reintroduction of a portion of the coherent illumination as a reference beam into the second optical system. An image recording device records each sub-image formed as a result of interference between the illumination that is scattered by the 3D object and the reference beam.
Public/Granted literature
- US20160161731A1 STRUCTURAL ILLUMINATION AND EVANESCENT COUPLING FOR THE EXTENSION OF IMAGING INTERFEROMETRIC MICROSCOPY Public/Granted day:2016-06-09
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