Invention Grant
- Patent Title: Distance measurement device and distance measurement system
- Patent Title (中): 距离测量装置和距离测量系统
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Application No.: US13795379Application Date: 2013-03-12
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Publication No.: US09541386B2Publication Date: 2017-01-10
- Inventor: Yoshiyuki Kurokawa
- Applicant: Semiconductor Energy Laboratory Co., Ltd.
- Applicant Address: JP Kanagawa-ken
- Assignee: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
- Current Assignee: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
- Current Assignee Address: JP Kanagawa-ken
- Agency: Robinson Intellectual Property Law Office
- Agent Eric J. Robinson
- Priority: JP2012-063338 20120321
- Main IPC: H01L27/148
- IPC: H01L27/148 ; G01C3/08 ; H01L31/02 ; G01S17/10 ; G01S17/08 ; G01S17/36 ; G01S17/32 ; G01S17/89 ; G01S7/481 ; G01S7/486

Abstract:
A distance measurement device with high detection accuracy. The distance measurement device includes a photosensor including a light-receiving element, a first transistor, and a second transistor; a wiring; a signal line; and a power supply line. The wiring is electrically connected to one electrode of the light-receiving element. The signal line is electrically connected to a gate electrode of the first transistor. The power supply line is electrically connected to one of a source electrode and a drain electrode of the second transistor. One of a source electrode and a drain electrode of the first transistor is electrically connected to a gate electrode of the second transistor. The other of the source electrode and the drain electrode of the first transistor is electrically connected to the other electrode of the light-receiving element and the other of the source electrode and the drain electrode of the second transistor.
Public/Granted literature
- US20130250274A1 DISTANCE MEASUREMENT DEVICE AND DISTANCE MEASUREMENT SYSTEM Public/Granted day:2013-09-26
Information query
IPC分类: