Invention Grant
- Patent Title: Particle sampling and measurement in the ambient air
- Patent Title (中): 在环境空气中进行颗粒取样和测量
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Application No.: US14031661Application Date: 2013-09-19
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Publication No.: US09541488B2Publication Date: 2017-01-10
- Inventor: Benjamin Y. H. Liu , Virgil A. Marple , Francisco Romay , Lin Li
- Applicant: MSP Corporation
- Applicant Address: US MN Shoreview
- Assignee: MSP CORPORATION
- Current Assignee: MSP CORPORATION
- Current Assignee Address: US MN Shoreview
- Agency: Westman, Champlin & Koehler, P.A.
- Agent Z. Peter Sawicki; Amanda M. Prose
- Main IPC: G01N15/06
- IPC: G01N15/06 ; G01N1/22 ; G01N5/02

Abstract:
An apparatus and method for sampling and measuring air born particulate matter includes an inlet for the particulate containing gas to enter. A mechanism then removes coarse particles larger than a selected size while permitting filtered particles of less than the selected size to pass through. A chamber containing a quartz crystal sensor permits the filtered particles that have passed through to deposit to create an output signal in response to the deposited particle mass.
Public/Granted literature
- US20140083167A1 PARTICLE SAMPLING AND MEASUREMENT IN THE AMBIENT AIR Public/Granted day:2014-03-27
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