Invention Grant
- Patent Title: Analytical test strip
- Patent Title (中): 分析测试条
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Application No.: US14811892Application Date: 2015-07-29
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Publication No.: US09541520B2Publication Date: 2017-01-10
- Inventor: James T. Moffat , Lawrence Ritchie , Steven John Setford , John Scott , Graeme J. Webster
- Applicant: Cilag GmbH International
- Applicant Address: CH Zug
- Assignee: Cilag GmbH International
- Current Assignee: Cilag GmbH International
- Current Assignee Address: CH Zug
- Main IPC: G01N27/327
- IPC: G01N27/327

Abstract:
An analytical test strip has mutually-insulated first and second electrodes arranged to define a sample-receiving chamber. Electrically-insulating layers are disposed over respective electrodes. First and second electrical contact pads are electrically connected to the first electrode, and a third pad to the second electrode. A first side of the test strip has a first electrically-insulating layer and the third pad, and a second side has the second electrically-insulating layer and the first and second pads. The third pad extends longitudinally from the sample-receiving chamber farther than does the first electrically-insulating layer. Methods for determining an analyte in a bodily-fluid sample and analytical test systems for use in the determination of an analyte in a bodily-fluid sample are also described.
Public/Granted literature
- US20150330936A1 ANALYTICAL TEST STRIP Public/Granted day:2015-11-19
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